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device characteristic

英 [dɪˈvaɪs ˌkærəktəˈrɪstɪk]

美 [dɪˈvaɪs ˌkærəktəˈrɪstɪk]

网络  设备特性

网络

英英释义

noun

  • any measurable property of a device measured under closely specified conditions
      Synonym:characteristic

    双语例句

    • The application results showed the device had main characteristic following: ( 1) good heat performance, ( 2) fast drying speed, ( 3) fruit stuff treated was clean.
      应用结果表明,这种装置具有如下主要特点:①良好的热性能;②干燥速度快;
    • The IC processing and device characteristic CAD system are very important parts in the microelectronic CAD system.
      集成电路工艺及器件特性计算机辅助设计系统是微电子CAD系统的重要组成部分。
    • Piezoelectric material for SAW devices is the decision factor affecting SAW device characteristic.
      压电材料是SAW器件基本材料,该基片材料是影响SAW器件性能的一个决定性因素。
    • The Electromechanical Device Servicing Characteristic and Countermeasure in the Coal Group
      煤炭集团机电设备维修的特点与对策
    • The experimental research of low-lift axial flow pump model device is introduced simply. According to experimental results. we conduct similarity conversion on true pumps device characteristic at different impeller diameter.
      简要介绍了低扬程轴流泵模型装置的试验研究,根据试验结果进行了不同转轮直径下实型泵装置特性的相似换算,该成果可以作为低扬程轴流泵站设计的参考。
    • This paper analyzes the influence of the test device cycling characteristic for fluid dynamic characteristic on the pulsation pressure measurement in seawater pipeline system.
      分析了流体动态特性实验台架本身的自循环特性对海水管路系统中脉动压力测量的影响。
    • Programmable logic device has the characteristic of high integration, high speed, high reliability and ISP, so it really suitable for the design.
      可编程逻辑器件具有高集成度、高速度、高可靠性、在线可编程(ISP)等特点,所以特别适合于本设计。
    • On the foundation of the existing test equipment, we have researched and developed the test system that can measure liquid crystal material structure parameter and liquid crystal device characteristic.
      在现有液晶测试设备基础上,研发了针对液晶材料结构参数和液晶器件显示特性进行测量的测试系统。
    • Familiar with main device characteristic in process and know-how in designing of process system.
      熟悉工艺流程中的一些主设备特性及工艺系统设计需注意事项。
    • Based on study, measurement and analysis of device noise power-spectrum, a fault-location approach that took advantage of device noise-characteristic and combined it with circuit theory was first proposed.
      在研究、测试、分析器件噪声功率谱的基础上,利用器件噪声的特性,结合电路理论,首次提出对故障组件内的故障元件进行测试定位和比较放大器输入端电阻阻值大小的研究方法。